Chemical strain kinetics induced by oxygen surface exchange in epitaxial films explored by time-resolved X-ray diffraction

Chemistry of Materials

Volumn 25, Issue 18, 2013, Pages 3640-3647

  Moreno, Roberto ^a   García, Pablo ^a   Zapata, James ^a   Roqueta, Jaume ^a   Chaigneau, Julienne ^a   Santiso, José ^a,b  

^a CATALAN INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY ICN2   (Spain)

^b CSIC   (Spain)

Author keywords

oxygen surface exchange; solid oxide fuel cells; solid state ionics

Indexed keywords

CONDUCTIVITY RELAXATION; ELEVATED TEMPERATURE; OXYGEN STOICHIOMETRY; OXYGEN SURFACE EXCHANGE; SOLID STATE IONICS; SOLID-SOLID INTERFACES; TIME-RESOLVED X-RAY DIFFRACTION; TRANSITION-METAL OXIDES;

EPITAXIAL FILMS; EPITAXIAL GROWTH; KINETICS; SOLID OXIDE FUEL CELLS (SOFC); SURFACES; TOOLS; X RAY DIFFRACTION;

OXYGEN;

EID: 84884876506     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm401714d     Document Type: Article

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