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Journal of Materials Chemistry A

Volumn 1, Issue 39, 2013, Pages 12154-12158

Evidence of an interlayer charge transfer route in BiCu1-xSeO

(7) Xu, Wei a Liu, Yong b Zhao, Li Dong c An, Pengfei a Lin, Yuan Hua d Marcelli, Augusto e,f Wu, Ziyu a,f

a INSTITUTE OF HIGH ENERGY PHYSICS (China)

b BEIJING INSTITUTE OF AERONAUTICAL MATERIALS (China)

c NORTHWESTERN UNIVERSITY (United States)

d TSINGHUA UNIVERSITY (China)

e INFN LABORATORI NAZIONALI DI FRASCATI (Italy)

f UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC CONFIGURATION; INTERMEDIATE TEMPERATURES; LAYERED COMPOUND; PROJECTED DENSITY OF STATE; THEORETICAL SIMULATION; THERMO-ELECTRIC MATERIALS; X-RAY ABSORPTION NEAR EDGE SPECTROSCOPY; XANES MEASUREMENTS;

COPPER; DENSITY FUNCTIONAL THEORY; ELECTRONIC STRUCTURE; TRANSPORT PROPERTIES;

CHARGE TRANSFER;

EID: 84884308698 PISSN: 20507488 EISSN: 20507496 Source Type: Journal
DOI: 10.1039/c3ta12094e Document Type: Article

Times cited : (28)

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