Stability of high-temperature dielectric properties for (1 - X) Ba 0.8 Ca 0.2 TiO 3-x Bi (Mg 0.5 Ti 0.5) O 3 ceramics

Journal of the American Ceramic Society

Volumn 96, Issue 9, 2013, Pages 2887-2892

  Zeb, Aurang ^a   Milne, Steven J ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CONVENTIONAL MIXED OXIDE ROUTE; DIELECTRIC MEASUREMENTS; HIGH TEMPERATURE; RELATIVE PERMITTIVITY; RELAXOR BEHAVIOR; SOLID SOLUTION SYSTEM; TEMPERATURE RANGE; TEMPERATURE SENSITIVITY;

CALCIUM; CERAMIC MATERIALS; TITANIUM OXIDES; X RAY DIFFRACTION;

PERMITTIVITY;

EID: 84884286529     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/jace.12412     Document Type: Article

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