Reversal of the lattice structure in SrCoOx epitaxial thin films studied by real-time optical spectroscopy and first-principles calculations

Physical Review Letters

Volumn 111, Issue 9, 2013, Pages

  Choi, Woo Seok ^a   Jeen, Hyoungjeen ^a   Lee, Jun Hee ^b   Seo, S S Ambrose ^c   Cooper, Valentino R ^a   Rabe, Karin M ^d   Lee, Ho Nyung ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b PRINCETON UNIVERSITY   (United States)

^c UNIVERSITY OF KENTUCKY   (United States)

^d RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHIC STRUCTURE; ELECTRONIC GROUND STATE; EPITAXIAL THIN FILMS; FIRST-PRINCIPLES CALCULATION; LATTICE STRUCTURES; OPTICAL SPECTROSCOPY; REAL TIME SPECTROSCOPIC ELLIPSOMETRY; TRANSITION-METAL OXIDES;

ELECTRONIC STRUCTURE; EPITAXIAL GROWTH; SEMICONDUCTOR INSULATOR BOUNDARIES; SINGLE CRYSTALS; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS;

CALCULATIONS;

EID: 84884269441     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.111.097401     Document Type: Article

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