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Volumn 84, Issue 4, 2013, Pages

Pulsed laser deposition with simultaneous in situ real-time monitoring of optical spectroscopic ellipsometry and reflection high-energy electron diffraction

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE; DIELECTRIC FUNCTIONS; GROWTH MECHANISMS; MODELING PROCESS; OPTICAL SPECTRA; REAL TIME MONITORING; SIMULTANEOUS MONITORING; THIN FILM LAYERS;

EID: 84876398363     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4798621     Document Type: Article
Times cited : (27)

References (27)
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    • 0000392786 scopus 로고
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  • 17
    • 0002286733 scopus 로고    scopus 로고
    • 10.1364/JOSAA.14.001355
    • J. Lekner, J. Opt. Soc. Am. A 14, 1355 (1997); 10.1364/JOSAA.14.001355
    • (1997) J. Opt. Soc. Am. A , vol.14 , pp. 1355
    • Lekner, J.1
  • 18
    • 0344592079 scopus 로고    scopus 로고
    • 10.1364/JOSAA.15.002228
    • D. U. Fluckiger, J. Opt. Soc. Am. A 15, 2228 (1998). 10.1364/JOSAA.15. 002228
    • (1998) J. Opt. Soc. Am. A , vol.15 , pp. 2228
    • Fluckiger, D.U.1
  • 20
    • 0030913416 scopus 로고    scopus 로고
    • 10.1126/science.276.5314.911
    • C. N. R. Rao and A. K. Cheetham, Science 276, 911 (1997). 10.1126/science.276.5314.911
    • (1997) Science , vol.276 , pp. 911
    • Rao, C.N.R.1    Cheetham, A.K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.