메뉴 건너뛰기




Volumn 136, Issue , 2014, Pages 73-80

Effective temperature of an ultracold electron source based on near-threshold photoionization

Author keywords

Coherence; Photoionization; Ultracold electron source; Ultrafast electron diffraction

Indexed keywords

EFFECTIVE TEMPERATURE; LASER-COOLED ATOMS; NANOSECOND LASERS; PULSED ELECTRON; SOURCE TEMPERATURE; TRANSVERSE COHERENCE; ULTRACOLD ELECTRON SOURCE; ULTRAFAST ELECTRON DIFFRACTION;

EID: 84884263920     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.07.017     Document Type: Article
Times cited : (32)

References (20)
  • 1
    • 80052046145 scopus 로고    scopus 로고
    • Femtosecond electron diffraction. heralding the era of atomically resolved dynamics
    • Sciaini G., Miller R.J.D. Femtosecond electron diffraction. heralding the era of atomically resolved dynamics. Reports on Progress in Physics 2011, 74:096101.
    • (2011) Reports on Progress in Physics , vol.74 , pp. 096101
    • Sciaini, G.1    Miller, R.J.D.2
  • 13
    • 84884260535 scopus 로고    scopus 로고
    • NOAA National Geophysical Data Center, Magnetic Field Calculator
    • NOAA National Geophysical Data Center, Magnetic Field Calculator, 2012, . http://www.ngdc.noaa.gov/geomag-web.
    • (2012)
  • 14
    • 0031212211 scopus 로고    scopus 로고
    • Photoionization cross section measurement in a Rb vapor cell trap
    • Gabbanini C., Gozzini S., Lucchesini A. Photoionization cross section measurement in a Rb vapor cell trap. Optics Communications 1997, 141:25-28.
    • (1997) Optics Communications , vol.141 , pp. 25-28
    • Gabbanini, C.1    Gozzini, S.2    Lucchesini, A.3
  • 16
    • 84884235013 scopus 로고    scopus 로고
    • General Particle Tracer
    • S.B. Van der Geer, M.J. De Loos, General Particle Tracer, 2011, . http://www.pulsar.nl/gpt.
    • (2011)
    • Van Der Geer, S.B.1    De Loos, M.J.2
  • 19
    • 84884271555 scopus 로고    scopus 로고
    • An analytical model for the coherence length of electron bunches created by near-threshold photoionization
    • Under review
    • W.J. Engelen, E.J.D. Vredenbregt, O.J. Luiten, An analytical model for the coherence length of electron bunches created by near-threshold photoionization, under review.
    • Engelen, W.J.1    Vredenbregt, E.J.D.2    Luiten, O.J.3
  • 20
    • 84884235895 scopus 로고    scopus 로고
    • Influence of the photoionization laser polarization on the coherence length of electron bunches
    • In preparation
    • W.J. Engelen, D.J. Bakker, O.J. Luiten, E.J.D. Vredenbregt, Influence of the photoionization laser polarization on the coherence length of electron bunches, in preparation.
    • Engelen, W.J.1    Bakker, D.J.2    Luiten, O.J.3    Vredenbregt, E.J.D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.