Ultracold electron source for single-shot, Ultrafast electron diffraction

Microscopy and Microanalysis

Volumn 15, Issue 4, 2009, Pages 282-289

  Van Der Geer, S B ^a   De Loos, M J ^a   Vredenbregt, E J D ^a   Luiten, O J ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949111762     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S143192760909076X     Document Type: Conference Paper

References (22)

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