N-doped ZnO thin film for development of magnetic field sensor based on surface plasmon resonance

Optics Letters

Volumn 38, Issue 18, 2013, Pages 3542-3545

  Jindal, Kajal ^a   Tomar, Monika ^b   Katiyar, R S ^c   Gupta, Vinay ^a  

^a UNIVERSITY OF DELHI   (India)

^b UNIVERSITY OF DELHI   (India)

^c UNIVERSITY OF PUERTO RICO   (Puerto Rico)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED MAGNETIC FIELDS; FERROMAGNETIC SURFACES; MAGNETIC FIELD SENSORS; N-DOPED ZNO; N-DOPING; NITROGEN-DOPED; PURE ZNO; ZNO;

DOPING (ADDITIVES); FERROMAGNETIC MATERIALS; FERROMAGNETISM; MAGNETIC SENSORS; MAGNETOMETERS; METALLIC FILMS; PLASMONS; REFRACTIVE INDEX; ZINC OXIDE;

SURFACE PLASMON RESONANCE;

EID: 84884257976     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.38.003542     Document Type: Article

References (32)

1. D. Goldring, Z. Zalevsky, G. Shabtay, and D. Abraham, J. Opt. A 6, 98 (2004).
2. J. B. Khurgin, Appl. Phys. Lett. 89, 251115 (2006).
3. K. Bohnert, P. Gabus, J. Nehring, H. Brändle, and M. G. Brunzel, J. Lightwave Technol. 25, 3602 (2007).
4. P. Zu, C. C. Chan, W. S. Lew, L. Hu, Y. Jin, H. F. Liew, L. H. Chen, W. C. Wong, and X. Dong, IEEE Photon. J. 4, 491 (2012).
5. K. J. Chau, S. E. Irvine, and A. Y. Elezzabi, IEEE J. Quantum Electron. 40, 571 (2004).
6. L. K. Elbaum, T. Shibauchi, B. Argyle, L. Gignac, and D. Weller, Nature 410, 444 (2001).
7. K. Postava, D. Hrabovský, O. Životský, J. Pištora, N. Dix, R. Muralidharan, J. M. Caicedo, F. Sánchez, and J. Fontcuberta, J. Appl. Phys. 105, 07C124 (2009).
8. P. Gangopadhyay, G. Koeckelberghs, and A. Persoons, Chem. Mater. 23, 516 (2011).
9. S. Y. Yang, J. J. Chieh, H. E. Horng, C.-Y. Hong, and H. C. Yang, Appl. Phys. Lett. 84, 5204 (2004).
10. K. Schwinge, C. Müller, A. Mogilatenko, J. J. Paggel, and P. Fumagalli, J. Appl. Phys. 97, 103913 (2005).
11. A. L. Herrera-May, L. A. Aguilera-Cortés, and E. Manjarrez, Sensors 9, 7785 (2009).
12. R. Russo, C. Granata, P. Walke, A. Vettoliere, E. Esposito, and M. Russo, J. Nanopart. Res. 13, 5661 (2011).
13. A. Schuhl, F. N. V. Dau, and J. R. Childress, Appl. Phys. Lett. 66, 2751 (1995).
14. J. Zhai, Z. Xing, S. Dong, J. Li, and D. Viehland, Appl. Phys. Lett. 88, 062510 (2006).
15. R. Macedo, F. A. Cardoso, S. Cardoso, P. P. Freitas, J. Germano, and M. S. Piedade, Appl. Phys. Lett. 98, 103503 (2011).
16. V. I. Safarov, V. A. Kosobukin, C. Hermann, G. Lampel, J. Peretti, and C. Marliere, Phys. Rev. Lett. 73, 3584 (1994).
17. J. B. González-Díaz, A. García-Martín, G. Armelles, J. M. García-Martín, C. Clavero, A. Cebollada, R. A. Lukaszew, J. R. Skuza, D. P. Kumah, and R. Clarke, Phys. Rev. B 76, 153402 (2007).
18. K. Jindal, M. Tomar, and V. Gupta, Analyst 138, 4353 (2013).
19. X. L. Wang, C. Y. Luan, Q. Shao, A. Pruna, C. W. Leung, R. Lortz, J. A. Zapien, and A. Ruotolo, Appl. Phys. Lett. 102, 102112 (2013).
20. K. Ando, H. Saito, Z. Jin, T. Fukumura, M. Kawasaki, Y. Matsumoto, and H. Koinuma, Appl. Phys. Lett. 78, 2700 (2001).
21. Y. P. Zhang, S. S. Yan, Y. H. Liu, M. J. Ren, Y. Fang, Y. X. Chen, G. L. Liu, L. M. Mei, J. P. Liu, J. H. Qiu, S. Y. Wang, and L. Y. Chen, Appl. Phys. Lett. 89, 042501 (2006).
22. K. Y. Wu, Q. Q. Fang, W. N. Wang, C. Zhou, W. J. Huang, J. G. Li, Q. R. Lv, Y. M. Liu, Q. P. Zhang, and H. M. Zhang, J. Appl. Phys. 108, 063530 (2010).
23. K. Jindal, M. Tomar, R. S. Katiyar, and V. Gupta, J. Appl. Phys. 111, 102805 (2012).
24. Joint Committee on Power Diffraction Standard (JCPDS), File No. 04-0784
25. M. Futsuhara, K. Yoshioka, and O. Takai, Thin Solid Films 317, 322 (1998).
26. S. Saha, N. Mehan, K. Sreenivas, and V. Gupta, Appl. Phys. Lett. 95, 071106 (2009).
27. S. Zhang, L. Berguiga, J. Elezgaray, T. Roland, C. F. Moskalenko, and F. Argoul, Surf. Sci. 601, 5445 (2007).
28. N. Mehan, V. Gupta, K. Sreenivas, and A. Mansingh, J. Appl. Phys. 96, 3134 (2004).
29. O. S. Heavens, Optical Properties of Thin Solid Films (Butterworths Scientific, 1955).
30. C.-Y. You and S.-C. Shin, Appl. Phys. Lett. 69, 1315 (1996).
31. Z. J. Yang and M. R. Scheinfein, J. Appl. Phys. 74, 6810 (1993).
32. M. Fronk, B. Bräuer, J. Kortus, O. G. Schmidt, D. R. T. Zahn, and G. Salvan, Phys. Rev. B 79, 235305 (2009).