Shape- and size-dependent electronic capacitance in nanostructured materials

Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 469, Issue 2158, 2013, Pages

  Singh, Maibam Birla ^a   Kant, Rama ^a  

^a UNIVERSITY OF DELHI   (India)

Author keywords

Arbitrary shape; Capacitance localization; Curvature; Electronic capacitance; Thomas Fermi screening

Indexed keywords

NANOSTRUCTURED MATERIALS; NANOSTRUCTURES;

ARBITRARY SHAPE; CURVATURE; CURVATURE CORRECTION; ELECTRONIC CAPACITANCE; ELECTRONIC SCREENING; MULTIPLE SCATTERING METHOD; SPILLOVER CORRECTIONS; THOMAS-FERMI;

CAPACITANCE;

EID: 84884144899     PISSN: 13645021     EISSN: 14712946     Source Type: Journal    
DOI: 10.1098/rspa.2013.0163     Document Type: Article

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