Stimulated X-ray emission for materials science

Nature

Volumn 501, Issue 7466, 2013, Pages 191-194

  Beye, M ^a   Schreck, S ^a,b   Sorgenfrei, F ^a,c   Trabant, C ^a,b,d   Pontius, N ^a   Schußler Langeheine C ^a   Wurth, W ^c   Fohlisch A ^a,b  

^a HAHN MEITNER INSTITUT   (Germany)

^b UNIVERSITY OF POTSDAM   (Germany)

^c UNIVERSITY OF HAMBURG   (Germany)

^d UNIVERSITY OF COLOGNE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

CRYSTALLINITY; DISPERSION; ENERGY; PHYSICS; SILICON; SPECTRAL RESOLUTION; X-RAY;

ARTICLE; PHOTON; PRIORITY JOURNAL; RADIATION SCATTERING; X RAY;

EID: 84884130637     PISSN: 00280836     EISSN: 14764687     Source Type: Journal    
DOI: 10.1038/nature12449     Document Type: Article

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