X-ray absorption fine structure combined with X-ray fluorescence spectrometry. Improvement of spectral resolution at the absorption edges of 9-29 keV

Analytical Chemistry

Volumn 77, Issue 21, 2005, Pages 6969-6975

  Izumi, Yasuo ^a   Nagamori, Hiroyasu ^a   Kiyotaki, Fumitaka ^a   Masih, Dilshad ^a   Minato, Taketoshi ^a   Roisin, Eric ^b   Candy, Jean Pierre ^b   Tanida, Hajime ^c   Uruga, Tomoya ^c  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b UMR 5265   (France)

^c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; DATA REDUCTION; FLUORESCENCE; PROBLEM SOLVING; RAMAN SCATTERING; X RAY ANALYSIS;

HIGH ENERGY ABSORPTION EDGE; LIFETIME BROADENING; X-RAY ABSORPTION FINE STRUCTURE; X-RAY FLUORESCENCE SPECTROSCOPY;

ABSORPTION;

COPPER; LEAD; PLATINUM; POTASSIUM; SILICON DIOXIDE; TIN;

AB INITIO CALCULATION; ARTICLE; SPECTROFLUOROMETRY; STRUCTURE ANALYSIS; THEORY; X RAY ABSORPTION NEAR EDGE STRUCTURE; X RAY ANALYSIS; X RAY FLUORESCENCE;

EID: 27544494590     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac0512453     Document Type: Article

References (40)

1. Stöhr, J. NEXAFS Spectroscopy; Springer: Berlin-Heidelberg, 1992.
2. Koningsberger, D. C., Prins, R., Eds. X-ray Absorption-Principles, Applications, Techniques of EXAFS, SEXAFS, and XANES: John Wiley & Sons: New York, 1988.
3. Van Grieken, R. E., Markowicz, A. A., Eds. Handbook of X-ray Spectrometry, 2nd ed.; Marcel Dekker: New York, 2002.
4. Iwasawa, Y., Ed. X-ray Absorption Fine Structure for Catalysts and Surfaces; World Scientific: Singapore, 1996.
5. Nishihata, Y.; Emura, S.; Maeda, H.; Kubozono, Y.; Harada, M.; Uruga, T.; Tanida, H.; Yoneda, Y.; Mizuki, J.; Emoto, T. J. Synchrotron Radiat. 1999, 6, 149-151.
6. Nishihata, Y.; Kamishima, O.; Kubozono, Y.; Maeda, H.; Emura, S. J. Synchrotron Radiat. 1998, 5, 1007-1009.
7. Hämäläinen, K.; Siddons, D. P.; Hastings, J. B.; Berman, L. E. Phys. Rev. Lett. 1991, 67, 2850-2853.
8. Krause, M. O.; Oliver, J. H. J. Phys. Chem. Ref. Data 1979, 8, 329-338.
9. de Groot, F. W. F. Top. Catal. 2000, 10, 179-186.
10. Izumi, Y.; Nagamori, H. Bull. Chem. Soc. Jpn. 2000, 73, 1581-1587.
11. Izumi, Y.; Kiyotaki, F.; Yagi, N.; Vlaicu, A.; Nisawa, A.; Fukushima, S.; Yoshitake, H.; Iwasawa, Y. J. Phys. Chem. B 2005, 109, 14884-14891.
12. Izumi, Y.; Kiyotaki, F.; Yoshitake, H.; Aika, K.; Sugihara, T.; Tatsumi, T.; Tanizawa, Y.; Shido, T.; Iwasawa, Y. Chem. Lett. 2002, 1154-1155.
13. Izumi, Y.; Kiyotaki, F.; Yoshitake, H.; Aika, K.; Sugihara, T.; Tatsumi, T.; Tanizawa, Y.; Shido, T.; Iwasawa, Y. Chem. Commun. 2002, 2402-2403.
14. Izumi, Y.; Kiyotaki, F.; Nagamori, H.; Minato, T. J. Electron Spectrosc. Relat. Phenom. 2001, 119, 193-199.
15. Izumi, Y.; Oyanagi, H.; Nagamori, H. Bull. Chem. Soc. Jpn. 2000, 73, 2017-2023.
16. Izumi, Y.; Masih, D.; Aika, K.; Seida, Y. J. Phys. Chem. B 2005, 109, 3227-3232.
17. Izumi, Y.; Kiyotaki, F.; Minato, T.; Seida, Y. Anal. Chem. 2002, 74, 3819-3823.
18. Izumi, Y.; Kiyotaki, F.; Seida, Y. J. Phys. Chem. B 2002, 106, 1518-1520.
19. Humblot, F.; Didillon, D.; Lepeltier, F.; Candy, J. P.; Corker, J.; Clause, O.; Bayard, F.; Basset, J. M. J. Am. Chem. Soc. 1998, 120, 137-146.
20. Bearden, J. A. Rev. Mod. Phys. 1967, 39, 78-124.
21. 3-, and Sn K-edges, respectively).
22. Ankudinov, A. L.; Ravel, B.; Rehr, J. J.; Condradson, S. D. Phys. Rev. B 1998, 58, 7565-7576.
23. Kau, L.; Spira-Solomon, D. J.; Penner-Hahn, J. E.; Hodgson, K. O.; Solomon, E. I. J. Am. Chem. Soc. 1987, 109, 6433-6442.
24. Pickering, I. J.; George, G. N. Inorg. Chem. 1995, 34, 3142-3152.
25. Shadle, S. E.; Penner-Hahn, J. E.; Schugar, H. J.; Hedman, B.; Hodgson, K. O.; Solomon, E. I. J. Am. Chem. Soc. 1993, 115, 767-776.
26. Kuroda, Y.; Yoshikawa, Y.; Konno, S.; Hamano, H.; Maeda, H. J. Phys. Chem. 1995, 99, 10621-10628.
27. Saini, N.; Lanzara, A.; Bianconi, A.; Oyanagi, H. Phys. Rev. B 1998, 58, 11768-11773.
28. Georgopoulos, P.; Knapp, G. S. J. Appl. Crystallogr. 1981, 14, 3-7.
29. Grush, M. M.; Christou, G.; Hämäläinen, K.; Cramer, S. P. J. Am. Chem. Soc. 1995, 117, 5895-5896.
30. Glatzel, P.; Bergmann, U. Coord. Chem. Rev. 2005, 249, 65-95.
31. Rouff, A. A.; Elzinga, E. J.; Reeder, R. J. Environ. Sci. Technol 2004, 38, 1700-1707.
32. Huang, F.; Jao, H.; Hung, W.; Chen, K.; Wang, C. J. Phys. Chem. B 2004, 108, 20458-20464.
33. Rose, J.; Moulin, I.; Hazemann, J.; Masion, A.; Bertsch, P. M.; Bottero, J.; Mosnier, F.; Haehnel, C. Langmuir 2000, 16, 9900-9906.
34. 2 surface may be partially oxidized.
35. Heijboer, W. M.; Glatzel, P.; Sawant, K. R.; Lobo, R. F.; Bergmann, U.; Barrea, R. A.; Konongsberger, D. C.; Weckhuysen, B. M.; de Groot, F. M. F. J. Phys. Chem. B 2004, 108, 10002-10011.
36. Onda, A.; Komatsu, T.; Yashima, T. J. Catal. 2004, 221, 378-385.
37. Grandjean, D.; Benfield, R. E.; Nayral, C.; Maisonnat, A.; Chaudret, B. J. Phys. Chem. B 2004, 108, 8876-8887.
38. Sakakibara, N.; Takahashi, Y.; Yamaguchi, Y.; Shibata, K.; Uruga, T. Chem. Lett. 2004, 33, 264-265.
39. Takahashi, Y.; Sakakibara, N.; Nomura, M. Anal. Chem. 2004, 76, 4307-4314.
40. Stievano, L.; Wagner, F. E.; Calogero, S.; Recchia, S.; Dossi, C.; Psaro, R. Stud. Sur. Sci. Catal. 2000, 130D, 3903-3908 (Corma, A., Melo, F. V., Mendioroz, S., Fierro, J. L. G., Eds.).