SCOPUS 정보 검색 플랫폼

Volumn 77, Issue 8, 2013, Pages 972-974

Measuring AFM cantilever stiffness from a thermal noise spectrum

Author keywords

[No Author keywords available]

Indexed keywords

AFM CANTILEVERS; LARGE VOLUMES; MEASURING SYSTEMS; SPRING CONSTANTS; SYNCHRONOUS DETECTORS; THERMAL-NOISE SPECTRUM;

THERMAL NOISE;

ATOMIC FORCE MICROSCOPY;

EID: 84883851260 PISSN: 10628738 EISSN: None Source Type: Journal
DOI: 10.3103/S1062873813080248 Document Type: Conference Paper

Times cited : (4)

References (6)

1
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- Bykov, V.A., Belyaev, A.A., Medvedev, B.K., Saunin, S.A., and Sokolov, D.Yu., RF Patent 2159454C, 2000.
- (2000)
- Bykov, V.A.¹ Belyaev, A.A.² Medvedev, B.K.³ Saunin, S.A.⁴ Sokolov, D.Yu.⁵

2
- 0027540056
- 1993RScI.64.403C 10.1063/1.1144209
- Cleveland, J.P., Manne, S., Bocek, D., and Hansma, P.K., Rev. Sci. Instrum., 1993, vol. 64, p. 403.
- (1993) Rev. Sci. Instrum. , vol.64 , pp. 403
- Cleveland, J.P.¹ Manne, S.² Bocek, D.³ Hansma, P.K.⁴

3
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- 1993RScI.64.1868H 10.1063/1.1143970
- Hutter, J.L. and Bechhoefer, J., Rev. Sci. Instrum., 1993, vol. 64, p. 1868.
- (1993) Rev. Sci. Instrum. , vol.64 , pp. 1868
- Hutter, J.L.¹ Bechhoefer, J.²

4
- 0001155528
- 1999RScI.70.3967S 10.1063/1.1150021
- Sader, J.E., Chon, J.W.M., and Mulvaney, P., Rev. Sci. Instrum., 1999, vol. 70, p. 3967.
- (1999) Rev. Sci. Instrum. , vol.70 , pp. 3967
- Sader, J.E.¹ Chon, J.W.M.² Mulvaney, P.³

5
- 36449002856
- 1995RScI.66.3789S 10.1063/1.1145439
- Sader, J.E., Larson, I., Mulvaney, P., and White, L.R., Rev. Sci. Instrum., 1995, vol. 66, p. 3789.
- (1995) Rev. Sci. Instrum. , vol.66 , pp. 3789
- Sader, J.E.¹ Larson, I.² Mulvaney, P.³ White, L.R.⁴

6
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- 2006Nanot.17.2135C 10.1088/0957-4484/17/9/010
- Cook, S.M., Schäffer, T.E., Chynoweth, K.M., et al., Nanotechnol., 2006, vol. 17, p. 2135.
- (2006) Nanotechnol. , vol.17 , pp. 2135
- Cook, S.M.¹ Schäffer, T.E.² Chynoweth, K.M.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.