Plasmon-induced conductance enhancement in single-molecule junctions

Journal of Physical Chemistry Letters

Volumn 4, Issue 17, 2013, Pages 2811-2816

  Vadai, Michal ^a   Nachman, Nirit ^a   Ben Zion, Matan ^a   Bürkle, Marius ^b   Pauly, Fabian ^c   Cuevas, Juan Carlos ^d   Selzer, Yoram ^a  

^a TEL AVIV UNIVERSITY   (Israel)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c UNIVERSITY OF KONSTANZ   (Germany)

^d Ciudad Universitaria de Cantoblanco   (Spain)

Author keywords

break junction; photoassisted transport; plasmons; rectification; single molecule

Indexed keywords

BREAK JUNCTIONS; EXPERIMENTAL APPROACHES; EXPERIMENTAL PROCEDURE; PHOTO-ASSISTED TRANSPORTS; PLASMON FIELD ENHANCEMENT; RECTIFICATION; SINGLE MOLECULE; SINGLE-MOLECULE JUNCTIONS;

MOLECULES; NANOELECTRONICS; OPTICAL SYSTEMS;

PLASMONS;

EID: 84883808144     PISSN: None     EISSN: 19487185     Source Type: Journal    
DOI: 10.1021/jz4014008     Document Type: Article

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