Influence of morphologies and pseudocapacitive contributions forcharge storage in V2O5micro/nano-structures

Electrochimica Acta

Volumn 111, Issue , 2013, Pages 762-770

  Yin, Haihong ^a,b   Song, Changqing ^a,b   Wang, Yang ^b   Li, Shouchuan ^b   Zeng, Min ^b   Zhang, Zhengli ^b   Zhu, Ziqiang ^b   Yu, Ke ^b  

^a NANTONG UNIVERSITY   (China)

^b EAST CHINA NORMAL UNIVERSITY   (China)

Author keywords

Electrochemical properties; Pseudocapacitance; Vanadium pentoxide

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELECTROCHEMICAL PROPERTIES; ELECTRODES; ELECTROLYTES; LITHIUM COMPOUNDS; PARTICLE SIZE; VANADIUM PENTOXIDE;

CHEMICAL VAPOR DEPOSITION PROCESS; ELECTROCHEMICAL KINETICS; MORPHOLOGICAL EFFECTS; MORPHOLOGICAL PARAMETERS; OXIDATION TEMPERATURE; PSEUDO-CAPACITIVE PROPERTIES; PSEUDOCAPACITANCE; RELATIVE CONTRIBUTION;

CYCLIC VOLTAMMETRY;

EID: 84883710808     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2013.08.005     Document Type: Article

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