Sample size vs. Bias in defect prediction

2013 9th Joint Meeting of the European Software Engineering Conference and the ACM SIGSOFT Symposium on the Foundations of Software Engineering, ESEC/FSE 2013 - Proceedings

Volumn , Issue , 2013, Pages 147-157

  Rahman, Foyzur ^a   Posnett, Daryl ^a   Herraiz, Israel ^b   Devanbu, Premkumar ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSIDAD POLITÉCNICA DE MADRID   (Spain)

Author keywords

Bias; Defect prediction; Size

Indexed keywords

BIAS; DEFECT PREDICTION; EMPIRICAL SOFTWARE ENGINEERING; EXTERNAL VALIDITIES; MODEL PERFORMANCE; PREDICTION MODEL; SIMULATED DATASETS; SIZE;

DEFECTS; MATHEMATICAL MODELS; SAMPLING;

SOFTWARE ENGINEERING;

EID: 84883659473     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2491411.2491418     Document Type: Conference Paper

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