An automated visual inspection system for the glass industry

16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc.

Volumn , Issue , 2008, Pages 442-447

  Adamo, Francesco ^a   Attivissimo, Filipp ^a   Di Nisio, Attilio ^a   Savino, Mario ^a  

^a POLITECNICO DI BARI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATED INSPECTION SYSTEMS; AUTOMATED VISUAL INSPECTION SYSTEMS; CMOS CAMERA; COMPUTER VISION INSPECTION; ELECTRONIC INDUSTRIES; GLASS SURFACES; HUMAN CONTROL; IMAGE PROCESSING SYSTEM;

CMOS INTEGRATED CIRCUITS; GLASS INDUSTRY; IMAGE PROCESSING; INSPECTION EQUIPMENT; QUALITY CONTROL; REAL TIME SYSTEMS; SURFACE DEFECTS;

GLASS;

EID: 84883639345     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. M. Leconte, "Laser glass inspection system", International Society for Optical Engineering, pp. 878-882, 1997.
2. M. I Park, J. R. Choi, M. Park, D. S. Choi, S. C. Jeoung, "Rapid Prototyping of glass microfluid devices using femtosecond laser pulses", Mat. Res. Soc. Symp. Proc., pp. 1-6, 2004.
3. J. Cios, R. E. Tjia, N. Liu, R. Langenderfer, "Recognition of defects in glass ribbons using neural networks", IEEE Proc. of NSF Design and Manufacturing System, Dearborn, pp. 203-206, 1997.
4. D. Tsai, P. Lin, C. Lu "An independent component analysis-based filter design for defect detection in lowcontrast surface images", Pattern Recognition, pp. 1679-1694, 2006.
5. S. A. Bakalexis, Y. S. Boutalis, B. G. Mertioz, "Edge detection and image segmentation based on nonlinear anisotropic diffusion, IEEE Conf. on Digital Signal Processing, pp. 1203-1206, 2006.