The use of STEM imaging to analyze thickness variations due to electromigration-induced mass transport in thin polycrystalline nanobridges

Ultramicroscopy

Volumn 134, Issue , 2013, Pages 155-159

  Rudneva, Maria ^a   Kozlova, Tatiana ^a   Zandbergen, Henny W ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

AFM; Electromigration; Mass transport; Nanoelectrodes; Polycrystalline nanobridges; STEM

Indexed keywords

AFM; ELECTROMIGRATION-INDUCED MASS TRANSPORT; HIGH-ANGLE ANNULAR DARK FIELDS; MATERIAL DISTRIBUTION; NANO-BRIDGES; NANO-ELECTRODES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STEM;

DIFFRACTION; MASS TRANSFER; TRANSMISSION ELECTRON MICROSCOPY;

ELECTROMIGRATION;

PALLADIUM; PLATINUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; CORRELATION ANALYSIS; DIFFRACTION; IMAGE ANALYSIS; IMAGE PROCESSING; NANOTECHNOLOGY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNAL TRANSDUCTION; THICKNESS;

AFM; ATOMIC FORCE MICROSCOPY; ELECTROMIGRATION; MASS TRANSPORT; NANOELECTRODES; POLYCRYSTALLINE NANOBRIDGES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STEM;

ELECTRODES; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION; NANOSTRUCTURES;

EID: 84883551798     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.05.022     Document Type: Article

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