Synchrotron radiation analyses of lattice strain behaviors for rhombohedral Pb(Zn1/3Nb2/3)O3-PbTiO3 single crystals under electric fields

Journal of the Ceramic Society of Japan

Volumn 121, Issue 1416, 2013, Pages 632-637

  Kitanaka, Yuuki ^a   Noguchi, Yuji ^a   Miyayama, Masaru ^a   Kagawa, Yutaka ^a   Moriyoshi, Chikako ^a,b   Kuroiwa, Yoshihiro ^a,b   Fujisawa, Hironori ^a,c   Shimizu, Masaru ^a,c  

^a UNIVERSITY OF TOKYO   (Japan)

^b HIROSHIMA UNIVERSITY   (Japan)

^c UNIVERSITY OF HYOGO   (Japan)

Author keywords

Domain structure; Ferroelectricity; Piezoelectric strain property; PZN PT; Single crystal X ray diffraction

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALS; ELECTRIC FIELDS; FERROELECTRICITY; LEAD; PIEZOELECTRICITY; SCANNING PROBE MICROSCOPY; STRAIN; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAY DIFFRACTION; ZINC;

DOMAIN STRUCTURE; HIGH ENERGY SYNCHROTRON; MACROSCOPIC STRAINS; MONOCLINIC PHASIS; PIEZOELECTRIC STRAIN; PIEZORESPONSE FORCE MICROSCOPY; REVERSIBLE PHASE TRANSITION; SINGLE CRYSTAL X-RAY DIFFRACTION;

SINGLE CRYSTALS;

EID: 84882981138     PISSN: 18820743     EISSN: 13486535     Source Type: Journal    
DOI: 10.2109/jcersj2.121.632     Document Type: Article

References (40)

1. S. E. Park and T. R. Shrout, IEEE Trans. Ultrason. Ferroelectr. Freq. Control, 44, 11401147 (1997).
2. B. Noheda, Curr. Opin. Solid State Mater. Sci., 6, 2734 (2002).
3. S.-E. E. Park and W. Hackenberger, Curr. Opin. Solid State Mater. Sci., 6, 1118 (2002).
4. J. Kuwata, K. Uchino and S. Nomura, Jpn. J. Appl. Phys., 21, 12981302 (1982).
5. T. R. Shrout, Z. P. Chang, N. C. Kim and S. Markgraf, Ferroelectrics Lett, 12, 6369 (1990).
6. S.-E. Park and T. R. Shrout, J. Appl. Phys., 82, 18041811 (1997).
7. T. Ogawa, Y. Yamauchi, Y. Numamoto, M. Matsushita and Y. Tachi, Jpn. J. Appl. Phys., 41, L55L57 (2002).
8. D. Damjanovic, M. Budimir, M. Davis and N. Setter, Appl. Phys. Lett., 83, 527529 (2003).
9. R. Zhang, B. Jiang and W. W. Cao, Appl. Phys. Lett., 82, 787789 (2003).
10. H. X. Fu and R. E. Cohen, Nature, 403, 281283 (2000).
11. S. Wada, S. E. Park, L. E. Cross and T. R. Shrout, Ferroelectrics, 221, 147155 (1999).
12. J. Yin and W. Cao, J. Appl. Phys., 87, 74387441 (2000).
13. M. Abplanalp, D. Barosova, P. Bridenbaugh, J. Erhart, J. Fousek, P. Gunter, J. Nosek and M. Sulc, J. Appl. Phys., 91, 37973805 (2002).
14. S. Wada, S. Suzuki, T. Noma, T. Suzuki, M. Osada, M. Kakihana, S. E. Park, L. E. Cross and T. R. Shrout, Jpn. J. Appl. Phys., 38, 55055511 (1999).
15. K. Nakamura, T. Tokiwa and Y. Kawamura, J. Appl. Phys., 91, 92729276 (2002).
16. S. Wada, K. Muraoka, H. Kakemoto, T. Tsurumi and H. Kumagai, Jpn. J. Appl. Phys., 43, 66926700 (2004).
17. J. Hlinka, P. Ondrejkovic and P. Marton, Nanotechnology, 20, 105709 (2009).
18. M. Davis, D. Damjanovic and N. Setter, Phys. Rev. B, 73, 014115 (2006).
19. K. Sugimoto, H. Ohsumi, S. Aoyagi, E. Nishibori, C. Moriyoshi, Y. Kuroiwa, H. Sawa and M. Takata, AIP Conf. Proc., 1234, 887890 (2010).
20. C. Moriyoshi, S. Hiramoto, H. Ohkubo, Y. Kuroiwa, H. Osawa, K. Sugimoto, S. Kimura, M. Takata, Y. Kitanaka, Y. Noguchi and M. Miyayama, Jpn. J. Appl. Phys., 50, 09NE05 (2011).
21. H. Okino, J. Sakamoto and T. Yamamoto, Jpn. J. Appl. Phys., 42, 62096213 (2003).
22. H. Fujisawa, M. Shimizu, H. Niu, H. Nonomura and K. Honda, Appl. Phys. Lett., 86, 012903 (2005).
23. S. Jesse, B. Mirman and S. V. Kalinin, Appl. Phys. Lett., 89, 022906 (2006).
24. B. Noheda, D. E. Cox, G. Shirane, S. E. Park, L. E. Cross and Z. Zhong, Phys. Rev. Lett., 86, 38913894 (2001).
25. B. Noheda, Z. Zhong, D. E. Cox, G. Shirane, S. E. Park and P. Rehrig, Phys. Rev. B, 65, 224101 (2002).
26. D. Vanderbilt and M. H. Cohen, Phys. Rev. B, 63, 094108 (2001).
27. Y. Uesu, M. Matsuda, Y. Yamada, K. Fujishiro, D. E. Cox, B. Noheda and G. Shirane, J. Phys. Soc. Jpn., 71, 960965 (2002).
28. S. F. Liu, S. E. Park, T. R. Shrout and L. E. Cross, J. Appl. Phys., 85, 28102814 (1999).
29. J. Fousek and V. Janovec, J. Appl. Phys., 40, 135142 (1969).
30. S. K. Streiffer, C. B. Parker, A. E. Romanov, M. J. Lefevre, L. Zhao, J. S. Speck, W. Pompe, C. M. Foster and G. R. Bai, J. Appl. Phys., 83, 27422753 (1998).
31. J. Erhart and W. W. Cao, Ferroelectrics, 426, 1320 (2012).
32. S. F. Liu, S. E. Park, H. Lei, L. E. Cross and T. R. Shrout, Ferroelectrics, 221, 169174 (1999).
33. S. Wada, K. Yako, H. Kakemoto, T. Tsurumi and T. Kiguchi, J. Appl. Phys., 98, 014109 (2005).
34. B. Meyer and D. Vanderbilt, Phys. Rev. B, 65, 104111 (2002).
35. Y. Kitanaka, Y. Noguchi and M. Miyayama, Phys. Rev. B, 81, 094114 (2010).
36. G. A. Samara, J. Phys.: Condens. Matter, 15, R367R411 (2003).
37. G. Xu, Z. Zhong, Y. Bing, Z. G. Ye and G. Shirane, Nat. Mater., 5, 134140 (2006).
38. A. A. Bokov and Z. G. Ye, J. Mater. Sci., 41, 3152 (2006).
39. D. Viehland, J. Appl. Phys., 88, 47944806 (2000).
40. Y. U. Wang, Phys. Rev. B, 76, 024108 (2007).