Diffusivity of point defects in the passive film on Fe

Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers

Volumn , Issue , 2006, Pages 311-316

  Ahn, SeJin ^a   Kwon, HyukSang ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84882841294     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1016/B978-044452224-5/50050-0     Document Type: Chapter

References (15)

1. Macdonald D.D. J. Electrochem. Soc. 1992, 139:3434.
2. Macdonald D.D., Biaggio S.R., Song H. J. Electrochem. Soc. 1992, 139:170.
3. Liu J., Macdonald D.D. J. Electrochem. Soc. 2001, 148:B425.
4. Sikora E., Sikora J., Macdonald D.D. Electrochim. Acta 1996, 41:783.
5. Bojinov M. Electrochim. Acta 1997, 42:3489.
6. Cheng Y.F., Yang C., Luo J.L. Thin Solid Films 2002, 416:169.
7. Itaka I., Miyake S., Iimori T. Nature 1937, 139:156.
8. Ryan M.P., Newman R.C., Thompson G.E. J. Electrochem. Soc. 1995, 142:L177.
9. Davenport A.J., Oblonsky L.J., Ryan M.P., Toney M.F. J. Electrochem. Soc. 2000, 147:2162.
10. Kim J.S., Cho E.A., Kwon H.S. Corrosion Science 2001, 43:1403.
11. Stimming U, Schultze J.W. Electrochim. Acta. 1979, 24:859.
12. Azumi K., Ohtsuka T., Sato N. J. Electrochem. Soc. 1987, 134:1352.
13. Hakiki N.E., Cunha Belo M.Da J. Electrochem. Soc. 1995, 143:3088.
14. Bojinov M., Laitinen T., Makela K., Saario T. J. Electrochem. Soc. 2001, 148:B243.
15. Guo X.P., Tomoe Y., Imaizumi H., Katoh K. J. Electroanal. Chem. 1998, 445:95.