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Journal of Applied Physics

Volumn 114, Issue 4, 2013, Pages

Thickness dependence of the magnetoelastic effect of CoFe2O 4 films grown on piezoelectric substrates

(5) Rus, S F a Herklotz, A b,c Roth, R b Schultz, L c Dorr K b

a POLITEHNICA UNIVERSITY OF TIMISOARA (Romania)

b MARTIN LUTHER UNIVERSITY HALLE WITTENBERG (Germany)

c IFW DRESDEN (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IN-PLANE STRAINS; MAGNETOELASTIC EFFECTS; PIEZOELECTRIC SUBSTRATES; REMANENT MAGNETIZATION; STRAIN STATE; STRAIN-INDUCED CHANGE; THICKNESS DEPENDENCE; VARYING THICKNESS;

ELECTRIC FIELDS; EPITAXIAL FILMS; LEAD; PIEZOELECTRICITY; STRAIN; SUBSTRATES;

EPITAXIAL GROWTH;

EID: 84882387366 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.4816686 Document Type: Article

Times cited : (10)

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