Performance evaluation of the GE eXplore CT 120 micro-CT for various scanning protocols

IEEE Nuclear Science Symposium Conference Record

Volumn , Issue , 2012, Pages 3783-3785

  Bahri, Mohamed A ^a   Bretin, Florian ^a   Warnock, Geoffrey I ^a   Luxen, Andre ^a   Salmon, Eric ^a   Plenevaux, Alain ^a   Seret, Alain ^a  

^a UNIVERSITY OF LIÈGE   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

BAR PATTERN; CONTRAST DISCRIMINATION; DETECTABILITY; GENERAL ELECTRICS; GEOMETRIC ACCURACY; LOW CONTRAST; NOISE LEVELS; PHANTOM IMAGES;

MEDICAL IMAGING; NUCLEAR PHYSICS; QUALITY ASSURANCE; TISSUE;

COMPUTERIZED TOMOGRAPHY;

EID: 84881566450     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2012.6551868     Document Type: Conference Paper

References (7)

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