Characterization of graphene layers by Kelvin probe force microscopy and micro-Raman spectroscopy

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 10, Issue 7-8, 2013, Pages 1172-1175

  Nazarov, A N ^a   Gordienko, S O ^a   Lytvyn, P M ^a   Strelchuk, V V ^a   Nikolenko, A S ^a   Vasin, A V ^a   Rusavsky, A V ^a   Lysenko, V S ^a   Popov, V P ^b  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

^b INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

Author keywords

Atomic force microscopy; Graphene; Kelvin probe force microscopy; Magnetron sputtering; Micro Raman spectroscopy

Indexed keywords

ATOM FORCE MICROSCOPY (AFM); KELVIN PROBE FORCE MICROSCOPY; MICRO RAMAN SPECTROSCOPY; NICKEL SURFACES; OPTICAL CONTRAST; POTENTIAL DIFFERENCE; SCANNING KELVIN PROBE FORCE MICROSCOPY; SURFACE TOPOLOGY;

ATOMIC FORCE MICROSCOPY; MAGNETRON SPUTTERING; NICKEL; PROBES; RAMAN SPECTROSCOPY; SILICON WAFERS;

GRAPHENE;

EID: 84881542342     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.201200918     Document Type: Article

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