Modeling the delamination of amorphous-silicon thin film anode for lithium-ion battery

Journal of Power Sources

Volumn 246, Issue , 2014, Pages 149-159

  Pal, Siladitya ^a   Damle, Sameer S ^a   Patel, Siddharth H ^b   Datta, Moni K ^a   Kumta, Prashant N ^a   Maiti, Spandan ^a  

^a University of Pittsburgh   (United States)

^b Michigan Technological University   (United States)

Author keywords

Current collector; Diffusion induced stress (DIS); Interfacial delamination; Li ion battery a Si thin film anode; Mechanical properties

Indexed keywords

A-SI THIN FILMS; AMORPHOUS SILICON THIN FILMS; COMPUTATIONAL FRAMEWORK; CURRENT COLLECTOR; DIFFUSION INDUCED STRESSES (DIS); ELASTOPLASTIC DEFORMATION; ELECTROCHEMICAL CYCLING; INTERFACIAL DELAMINATION;

DELAMINATION; ELECTRIC CURRENT COLLECTORS; ELECTRODES; LITHIUM BATTERIES; MECHANICAL PROPERTIES; SECONDARY BATTERIES; SILICON; STRESSES; THIN FILMS;

AMORPHOUS SILICON;

EID: 84881410420     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2013.06.089     Document Type: Article

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