Stress mitigation during the lithiation of patterned amorphous Si islands

Journal of the Electrochemical Society

Volumn 159, Issue 1, 2012, Pages

  Soni, Sumit K ^a,b   Sheldon, Brian W ^a   Xiao, Xingcheng ^b   Verbrugge, Mark W ^b   Ahn, Dongjoon ^b   Haftbaradaran, H ^a   Gao, Huajian ^a  

^a Brown University   (United States)

^b GENERAL MOTORS CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SI; CONTINUUM MODEL; CURRENT COLLECTOR; IN-SITU MEASUREMENT; INTERFACIAL SLIDING; LITHIATION; LITHIUM DIFFUSION; MECHANICAL DEGRADATION; MODEL SYSTEM; NEGATIVE ELECTRODE; PATTERN SIZE; SI-BASED; STRESS GENERATION; STRESS MITIGATION; VOLUME EXPANSION;

CONTINUUM MECHANICS; ELECTRODES; LITHIUM; SILICON;

AMORPHOUS SILICON;

EID: 84857396078     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/2.048201jes     Document Type: Article

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