Characterization of doped TiO2 thin films obtained by pulsed laser deposition

Optoelectronics and Advanced Materials, Rapid Communications

Volumn 7, Issue 5-6, 2013, Pages 397-401

  Dobromir, M ^a   Manole, A V ^a   Ursu, L ^b   Ursu, C ^b   Neagu, M ^a   Luca, D ^a  

^a ALEXANDRU IOAN CUZA UNIVERSITY OF IASI   (Romania)

^b PETRU PONI INSTITUTE OF MACROMOLECULAR CHEMISTRY   (Romania)

Author keywords

Contact angle; Ellipsometry; Pulsed laser deposition; XPS

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; DOPING (ADDITIVES); ELLIPSOMETRY; NITROGEN COMPOUNDS; OPTICAL COATINGS; OXIDE MINERALS; PULSED LASER DEPOSITION; PULSED LASERS; SUPERHYDROPHILICITY; SURFACE ROUGHNESS; THIN FILMS; TITANIUM DIOXIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

CONVERSION PROCESS; GLASS SLIDES; N-DOPED; NITROGEN ATMOSPHERES; PHOTO-INDUCED; PLD TECHNIQUE; ROOT MEAN SQUARE ROUGHNESS; TIO2 THIN FILMS;

OPTICAL FILMS;

EID: 84881080831     PISSN: 18426573     EISSN: 20653824     Source Type: Journal    
DOI: None     Document Type: Article

References (21)

1. A. Fujishima, X. Zhang, D. A. Tryk, Surf. Sci. Rep. 63, 515 (2008).
2. T. L. Thompson, J. T. Yates, Chem. Rev. 106, 4428 (2006).
3. R. Asahi, T. Morikawa, T. Ohwaki, K. Aoki, Y. Taga, Science 293, 269 (2001).
4. Y. Nakano, T. Morikawa, T. Ohwhi, Y. Taga, Chem. Phys. 339, 20 (2007).
5. D. Heřman, J. Šicha, J. Musil, Vacuum 81, 285 (2006).
6. B. Farkas, J. Budai, I. Kabalci, P. Heszler, Z. Geretovszky, Appl. Surf. Sci. 254, 3484 (2008).
7. M. Batzill, E. H. Morales, U. Diebold, Chem. Phys. 339, 36 (2007).
8. S. Livraghi, M. R. Chierotti, E. Giamello, G. Magnacca, M. C. Paganini, G. Cappelletti, C. L. Bianchi, J. Phys. Chem. C 112, 17244 (2008).
9. E. Gyorgy, G. Socol, E. Axente, I. N. Mihailescu, C. Ducu, S. Ciuca, Appl. Surf. Sci. 247, 429 (2005).
10. P. Liu, W. Cai, M. Fang, Z. Li, H. Zeng, J. Hu1, X. Luo, W. Jing, Nanotechnology 20, 285707 (2009).
11. J. F. Moulder, W. F. Stickle, P. E. Sobol, K. D. Bomben, Handbook of X-ray Photolectron Spectrosopy, ULVAC-PHI Japan, Physical Electronics, USA, 1995.
12. Y. Cheng, Y. F. Zheng, Surf. Coat. Tech. 201, 6869 (2007).
13. N. C. Saha, H. G. Tompkins, J. Appl. Phys. 72, 3072 (1992).
14. C.-H. Yang, Z.-Q. Ma, Appl. Opt. 51, 5438 (2012).
15. M. J. Šćepanović, M. Grujić-Brojčin, Z. D. Dohčević-Mitrović, Z. V. Popović, Sci. Sinter. 41, 67 (2009).
16. R. M. A. Azzam, N. M. Bashara, Ellipsometry and polarized light, North-Holland Physics Publishing, Amsterdam, The Netherlands, 1986.
17. P. G. Wu, C. H. Ma, J. K. Shang, Appl. Phys. A 81, 1411 (2005).
18. H. Xie, F. L. Ng, X. T. Zeng, Thin Solid Films 517, 5066 (2009).
19. L.-J. Meng, V. Teixeira, H. N. Cui, F. Placido, Z. Xu, M. P. Dos Santos, Appl. Surf. Sci. 252, 7970 (2006).
20. J. Yao, Z. Fan, Y. Jin, Y. Zhao, H. He, J. Shao, Thin Solid Films 516, 1237 (2008).
21. A. Manole V. Dascaleanu, M. Dobromir, D. Luca, Surf. Interface Anal. 42, 947 (2010).