Vacancy profile in reverse osmosis membranes studied by positron annihilation lifetime measurements and molecular dynamics simulations

Journal of Physics: Conference Series

Volumn 443, Issue 1, 2013, Pages

  Shimazu, A ^a   Goto, H ^b   Shintani, T ^a   Hirose, M ^a   Suzuki, R ^c   Kobayashi, Y ^c  

^a NITTO DENKO CORPORATION   (Japan)

^b TOYOHASHI UNIVERSITY OF TECHNOLOGY   (Japan)

^c NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DESALINATION; ELECTRONS; HYDRATION; MEMBRANES; MOLECULAR DYNAMICS; PARTICLE BEAMS; POLYAMIDES; POSITRONS; REVERSE OSMOSIS; SUPERCOMPUTERS; VACANCIES;

DIFFUSION BEHAVIOR; MOLECULAR DYNAMICS METHODS; MOLECULAR DYNAMICS SIMULATIONS; POLYAMIDE MEMBRANES; POSITRON ANNIHILATION LIFETIME MEASUREMENT; POSITRON ANNIHILATION TECHNIQUE; SLOW POSITRON BEAM; TOKYO INSTITUTE OF TECHNOLOGY;

OSMOSIS MEMBRANES;

EID: 84881038096     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/443/1/012050     Document Type: Conference Paper

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