SEM/EDX and XRD characterization of silver nanocrystalline thin film prepared from organometallic solution precursor

Journal of Mining and Metallurgy, Section B: Metallurgy

Volumn 49, Issue 1, 2013, Pages 91-95

  Dimitrijevic R ^a   Cvetkovic O ^b   Miodragovic Z ^b,c   Simic M ^d   Manojlovic D ^b,c   Jovic V ^b  

^a UNIVERSITY OF BELGRADE   (Serbia)

^b UNIVERSITY OF BELGRADE   (Serbia)

^c UNIVERSITY OF BELGRADE   (Serbia)

^d Center of New Technologies (CNT)   (Serbia)

Author keywords

Ag nanoparticles; Chemical deposition; SEM EDX analysis; Sphere shaped; XRD technique

Indexed keywords

EID: 84880975200     PISSN: 14505339     EISSN: None     Source Type: Journal    
DOI: 10.2298/JMMB120111041D     Document Type: Article

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