Measurement of the spectral line shapes for orbital excitations in the Mott insulator CoO using high-resolution resonant inelastic x-ray scattering

Physical Review B - Condensed Matter and Materials Physics

Volumn 88, Issue 3, 2013, Pages

  Wray, L Andrew ^a   Li, J ^b   Qiu, Z Q ^b   Wen, Jinsheng ^b,c   Xu, Zhijun ^c   Gu, Genda ^c   Huang, Shih Wen ^a   Arenholz, Elke ^a   Yang, Wanli ^a   Hussain, Zahid ^a   Chuang, Yi De ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84880881891     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.88.035105     Document Type: Article

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