Uncovering selective excitations using the resonant profile of indirect inelastic x-ray scattering in correlated materials: Observing two-magnon scattering and relation to the dynamical structure factor

New Journal of Physics

Volumn 14, Issue , 2012, Pages

  Jia, C J ^a,b   Chen, C C ^a   Sorini, A P ^c   Moritz, B ^a,d   Devereaux, T P ^a,e  

^a SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^b STANFORD UNIVERSITY   (United States)

^c LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^d UNIVERSITY OF NORTH DAKOTA   (United States)

^e STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONDENSED MATTER SYSTEM; CORRELATED MATERIALS; CU K-EDGE; CUPRATES; DYNAMICAL STRUCTURE; ELEMENTARY EXCITATIONS; EXACT DIAGONALIZATION; HIGH-T; INCIDENT ENERGY; INCIDENT PHOTON ENERGY; INELASTIC X RAY SCATTERING; INTERMEDIATE STATE; PHOTON ENERGY; RESONANT INELASTIC X-RAY SCATTERING; SELECTIVE EXCITATIONS; SINGLE-BAND HUBBARD MODEL; SPECTROSCOPIC TECHNIQUE; STRONGLY CORRELATED MATERIALS; TWO-MAGNON SCATTERING;

COPPER COMPOUNDS;

X RAY SCATTERING;

EID: 84870397657     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/14/11/113038     Document Type: Article

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