Low-energy electron reflectivity from graphene: First-principles computations and approximate models

Ultramicroscopy

Volumn 130, Issue , 2013, Pages 101-108

  Feenstra, R M ^a   Widom, M ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Electron reflectivity; Graphene; Low energy electron microscopy; Surface

Indexed keywords

APPROXIMATE MODEL; BASIS FUNCTIONS; ELECTRON REFLECTIVITY; LOW ENERGY ELECTRON MICROSCOPY; LOW ENERGY ELECTRONS; MULTILAYER GRAPHENE; TIGHT BINDING MODEL; TRANSMISSION RESONANCE;

BINDING ENERGY; ELECTRONIC STRUCTURE; ELECTRONS; REFLECTION; SURFACES; VACUUM;

GRAPHENE;

GRAPHENE;

ARTICLE; CHEMICAL PARAMETERS; ELECTRON MICROSCOPY; ELECTRON REFLECTIVITY; MATHEMATICAL COMPUTING; MATHEMATICAL MODEL;

EID: 84880819381     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.02.011     Document Type: Article

References (25)

1. Hibino H., Kageshima H., Maeda F., Nagase M., Kobayashi Y., Yamaguchi H. Physical Review B 2008, 77:075413.
2. Locatelli A., Knox K.R., Cvetko D., Onur Mentes T., Angel Niño M., Wang S., Yilmax M.B., Kim P., Osgood R.M., Morgante A. ACS Nano 2010, 4:4879.
3. Virojanadara C., Syväjarvi M., Yakimova R., Johansson L.I., Zakharov A.A., Balasubramanian T. Physical Review B 2008, 78:245403.
4. Riedl C., Coletti C., Iwasaki T., Zakharov A.A., Starke U. Physical Review Letters 2009, 103:246804.
5. Luxmi N., Srivastava G., He R.M., Feenstra, Fisher P.J. Physical Review B 2010, 82:235406.
6. Sutter P., Sadowski J.T., Sutter E. Physical Review B 2009, 80:245411.
7. Dahal A., Addou R., Sutter P., Batzill M. Applied Physics Letters 2012, 100:241602.
8. S. Nie, W. Wu, S. Xing, Q. Yu, S.-S. Pei, and K.F. McCarty, arXiv:1202.1031v2 [cond-mat.mtrl-sci] (2012), to appear in New Journal of Physics.
9. Feenstra R.M., Srivastava N., Gao Q., Widom M., Diaconescu B., Ohta T., Kellogg G.L., Robinson J.T., Vlassiouk I.V. Phys. Rev. B 2013, 87:041406.
10. N. Srivastava, Q. Gao, M. Widom, R. M. Feenstra, S. Nie, K. F. McCarty, I. V. Vlassiouk, in preparation.
11. Posternak M., Baldereschi A., Freeman A.J., Wimmer E., Weinert M. Physical Review Letters 1983, 50:761.
12. Silkin V.M., Zhao J., Guinea F., Chulkov E.V., Echenique P.M., Petek H. Physical Review B 2009, 80:121408. references therein.
13. Stern F. Physical Review B 1978, 17:5009.
14. Krasovskii E.E., Strocov V.N. Journal of Physics: Condensed Matter 2009, 21:314009. references therein.
15. Kresse G., Hafner J. Physical Review B 1993, 47:RC558.
16. Kresse G., Furthmuller J. Physical Review B 1996, 54:11169.
17. Kresse G., Joubert J. Physical Review B 1999, 59:1758.
18. Jonker B.T., Bartelt N.C., Park R.L. Surface Science 1983, 127:183.
19. Zdyb R., Bauer E. Physical Review Letters 2002, 16:166403.
20. Altman M.S. Journal of Physics: Condensed Matter 2005, 17:S1305. references therein.
21. Perdew J.P., Burke K., Ernzerhof M. Physical Review Letters 1996, 77:3865.
22. Erratum ibid. Physical Review Letters 1997, 78:1396.
23. Hibino H., Mizuno S., Kageshima H., Nagase M., Yamaguchi H. Physical Review B 2009, 80:085406.
24. Saito R., Dresselhaus G., Dresselhaus M.S. Physical Properties of Carbon Nanotubes 1998, Imperioal College Press, London, p. 19.
25. Merzbacher E. Quantum Mechanics 1970, Wiley, New York, p. 109. 2nd ed.