Study of insertion characteristics of si neural probe with sharpened tip for minimally invasive insertion to brain

Japanese Journal of Applied Physics

Volumn 52, Issue 4 PART 2, 2013, Pages

  Lee, Sanghoon ^a   Kanno, Soichiro ^a   Kino, Hisashi ^a   Tanaka, Tetsu ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BRAIN PHANTOMS; BULK- MICROMACHINING; INSERTION FORCE; INSERTION RATES; MINIMALLY INVASIVE; PENETRATION FORCES; SIGNAL RECORDING; STANDARD PHOTOLITHOGRAPHY;

MECHANICAL PROPERTIES; PHOTOLITHOGRAPHY; SILICON; SOLID STATE DEVICES;

PROBES;

EID: 84880795585     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.7567/JJAP.52.04CL04     Document Type: Conference Paper

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