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Volumn 117, Issue 29, 2013, Pages 6288-6302

Quantitative orientation analysis by sum frequency generation in the presence of near-resonant background signal: Acetonitrile on rutile TiO 2 (110)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENT MATERIALS; MEASUREMENT TECHNIQUES; ORIENTATION INFORMATION; SEMICONDUCTOR SUBSTRATE; SOLID-VAPOR INTERFACE; SPECTRAL INTERFERENCE; SPECTROSCOPIC TECHNIQUE; SUM FREQUENCY GENERATION;

EID: 84880792312     PISSN: 10895639     EISSN: 15205215     Source Type: Journal    
DOI: 10.1021/jp401019p     Document Type: Article
Times cited : (40)

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