A new automatic contact point detection algorithm for AFM force curves

Microscopy Research and Technique

Volumn 76, Issue 8, 2013, Pages 870-876

  Benítez, Rafael ^a   Moreno flores, Susana ^b,c   Bolós, Vicente J ^d   Toca Herrera, José Luis ^b,c  

^a UNIVERSITY OF EXTREMADURA   (Spain)

^b UNIVERSITY OF NATURAL RESOURCES AND LIFE SCIENCES   (Austria)

^c CIC BIOMAGUNE   (Spain)

^d UNIVERSITY OF VALENCIA   (Spain)

Author keywords

Atomic force microscopy; Automatic contact point detection; Batch processing; Force measurements

Indexed keywords

BATCH DATA PROCESSING;

AFM; ATOMIC-FORCE-MICROSCOPY; AUTOMATIC CONTACT POINT DETECTION; BATCH PROCESSING; CONTACT POINTS; FORCE CURVE; FORCES MEASUREMENTS; LOCAL REGRESSION; POINT DETECTION; POINT DETECTION ALGORITHM;

ATOMIC FORCE MICROSCOPY;

EID: 84880752435     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.22241     Document Type: Article

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