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Volumn 28, Issue 3, 2013, Pages 1584-1591

A low-cost power-quality meter with series arc-fault detection capability for smart grid

Author keywords

Arc fault; Goertzel algorithm; microcontroller; power quality (PQ); smart meter; total harmonic distortion (THD); wavelet

Indexed keywords

ARC FAULTS; ASSEMBLER PROGRAMMING LANGUAGES; COMPUTATIONALLY EFFICIENT; GOERTZEL ALGORITHM; MICROCHIP MICROCONTROLLERS; TOTAL HARMONIC DISTORTION (THD); WAVELET; WAVELET MULTI-RESOLUTION ANALYSIS;

EID: 84880314414     PISSN: 08858977     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPWRD.2013.2251753     Document Type: Article
Times cited : (86)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.