|
Volumn 49, Issue 8, 2013, Pages 2120-2127
|
Chemical and morphological characterization of sulfonated polystyrene brushes in different environments
|
Author keywords
Atomic force microscopy (AFM); Polyelectrolyte; Polymer brushes; Polystyrene; Sulfonation
|
Indexed keywords
FOURIER TRANSFORMED INFRARED SPECTROSCOPY;
GRAFTING FROM METHOD;
MORPHOLOGICAL ANALYSIS;
MORPHOLOGICAL CHARACTERIZATION;
POLYMER BRUSHES;
PROTON NUCLEAR MAGNETIC RESONANCE;
SILICON WAFER SUBSTRATES;
SULFONATED POLYSTYRENE;
ATOMIC FORCE MICROSCOPY;
CONTACT ANGLE;
DENDRIMERS;
GRAFTING (CHEMICAL);
INFRARED SPECTROSCOPY;
POLYELECTROLYTES;
SILICON WAFERS;
SULFONATION;
POLYSTYRENES;
|
EID: 84880171515
PISSN: 00143057
EISSN: None
Source Type: Journal
DOI: 10.1016/j.eurpolymj.2013.04.025 Document Type: Conference Paper |
Times cited : (11)
|
References (30)
|