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Volumn 49, Issue 8, 2013, Pages 2120-2127

Chemical and morphological characterization of sulfonated polystyrene brushes in different environments

Author keywords

Atomic force microscopy (AFM); Polyelectrolyte; Polymer brushes; Polystyrene; Sulfonation

Indexed keywords

FOURIER TRANSFORMED INFRARED SPECTROSCOPY; GRAFTING FROM METHOD; MORPHOLOGICAL ANALYSIS; MORPHOLOGICAL CHARACTERIZATION; POLYMER BRUSHES; PROTON NUCLEAR MAGNETIC RESONANCE; SILICON WAFER SUBSTRATES; SULFONATED POLYSTYRENE;

EID: 84880171515     PISSN: 00143057     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.eurpolymj.2013.04.025     Document Type: Conference Paper
Times cited : (11)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.