Growth, characterization and electrochemical properties of hierarchical CuO nanostructures for supercapacitor applications

Materials Research Bulletin

Volumn 48, Issue 9, 2013, Pages 3136-3139

  Krishnamoorthy, Karthikeyan ^a   Kim, Sang Jae ^a  

^a Jeju National University   (South Korea)

Author keywords

Electrochemical measurements; Impedance spectroscopy; Nanostructures; Scanning electron microscopy; X ray photoelectron spectroscopy

Indexed keywords

CUO NANOSTRUCTURES; DEVICE APPLICATION; ELECTROCHEMICAL ANALYSIS; ELECTROCHEMICAL MEASUREMENTS; HIERARCHICAL STRUCTURES; IMPEDANCE SPECTROSCOPY; IN-SITU CRYSTALLIZATION; SUPERCAPACITOR APPLICATION;

CAPACITORS; CYCLIC VOLTAMMETRY; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ELECTROCHEMICAL PROPERTIES; PHOTOELECTRONS; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

NANOSTRUCTURES;

EID: 84880134335     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2013.04.082     Document Type: Article

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