Mining behavior graphs for "Backtrace" of noncrashing bugs

Proceedings of the 2005 SIAM International Conference on Data Mining, SDM 2005

Volumn , Issue , 2005, Pages 286-297

  Liu, Chao ^a   Yan, Xifeng ^a,b   Yu, Hwanjo ^a   Han, Jiawei ^a   Yu, Philip S ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Closed pattern; Data mining; Debugging; Noncrashing bugs; Software reliability; SVM

Indexed keywords

COMPUTER DEBUGGING; PROGRAM DEBUGGING; SOFTWARE RELIABILITY; SUPPORT VECTOR MACHINES;

CLASSIFICATION ACCURACY; CLASSIFICATION FRAMEWORK; CLOSED PATTERN; DATA MINING PROCESS; NONCRASHING BUGS; PERFORMANCE STUDY; SOFTWARE BEHAVIOR; SVM CLASSIFICATION;

DATA MINING;

EID: 84880122671     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1137/1.9781611972757.26     Document Type: Conference Paper

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