Low-loss electric and magnetic field-enhanced spectroscopy with subwavelength silicon dimers

Journal of Physical Chemistry C

Volumn 117, Issue 26, 2013, Pages 13573-13584

  Albella, Pablo ^a,b   Poyli, M Ameen ^a   Schmidt, Mikolaj K ^a   Maier, Stefan A ^b   Moreno, Fernando ^c   Sáenz, Juan José ^d   Aizpurua, Javier ^a  

^a CENTRO MIXTO CSIC UPV EHU   (Spain)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

^c UNIVERSITY OF CANTABRIA   (Spain)

^d UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC NANOPARTICLES; DIELECTRIC PARTICLES; ELECTROMAGNETIC BEHAVIOR; HIGH REFRACTIVE INDEX; HIGH-REFRACTIVE-INDEX MATERIALS; MAGNETODIELECTRICS; SCATTERED RADIATIONS; SURFACE FIELD ENHANCEMENT;

DIELECTRIC MATERIALS; DIMERS; GERMANIUM; INFRARED DEVICES; NANOPARTICLES; REFRACTIVE INDEX;

ELECTRIC LOSSES;

EID: 84879820435     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp4027018     Document Type: Article

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