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Volumn 47, Issue 7, 2013, Pages 1003-1007

Properties of Sb2S3 and Sb2Se3 thin films obtained by pulsed laser ablation

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[No Author keywords available]

Indexed keywords


EID: 84879818330     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/S1063782613070233     Document Type: Article
Times cited : (23)

References (17)
  • 13
    • 84879822101 scopus 로고    scopus 로고
    • Joint Committee on Powder Diffraction Standards (JCPDS), (American Society for Testing and Materials ASTM)
    • Joint Committee on Powder Diffraction Standards (JCPDS), Diffraction Data Card (American Society for Testing and Materials ASTM).
    • Diffraction Data Card
  • 15
    • 0003751863 scopus 로고
    • London: Butterworths Scientific
    • Z. G. Pinsker, Electron Diffraction (Butterworths Scientific, London, 1953; Akad. Nauk SSSR, Moscow, 1949).
    • (1953) Electron Diffraction
    • Pinsker, Z.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.