Effects of microstructural evolution on the thermoelectric properties of spark-plasma-sintered Ti0.3Zr0.35Hf0.35NiSn half-heusler compound

Journal of Electronic Materials

Volumn 42, Issue 7, 2013, Pages 1340-1345

  Appel, O ^a   Schwall, M ^b   Mogilyansky, D ^a   Kohne M ^c   Balke, B ^b   Gelbstein, Y ^a  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

^b JOHANNES GUTENBERG UNIVERSITY   (Germany)

^c ROBERT BOSCH GMBH   (Germany)

Author keywords

efficiency; figure of merit; Half Heusler; microstructure; thermoelectrics

Indexed keywords

ENERGY DISPERSIVE X-RAY SPECTROSCOPY; FIGURE OF MERITS; HALF-HEUSLER; HOMOGENIZATION TREATMENT; POWER GENERATION APPLICATIONS; SEMICONDUCTING COMPOUNDS; THERMOELECTRIC PROPERTIES; THERMOELECTRICS;

EFFICIENCY; ELECTRIC SPARKS; ENERGY DISPERSIVE SPECTROSCOPY; HAFNIUM; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SINTERING; TUNGSTEN; ZIRCONIUM;

HAFNIUM COMPOUNDS;

EID: 84879800636     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-012-2249-5     Document Type: Article

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