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Volumn 42, Issue 7, 2013, Pages 1319-1323

Test rig for high-temperature thermopower and electrical conductivity measurements

Author keywords

electrical measurements; high temperature testing; Thermoelectricity

Indexed keywords

AUTOMATIC DATA ACQUISITION; ELECTRICAL CONDUCTIVITY; ELECTRICAL CONDUCTIVITY MEASUREMENTS; ELECTRICAL MEASUREMENT; HIGH TEMPERATURE; K-TYPE THERMOCOUPLES; THERMAL CONTACT RESISTANCE; THERMOPOWER MEASUREMENTS;

EID: 84879796377     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-012-2437-3     Document Type: Article
Times cited : (19)

References (10)
  • 2
    • 0001028347 scopus 로고
    • 10.1063/1.1735334 1:CAS:528:DyaF3cXpsFWi
    • T.C. Harman, J. Appl. Phys. 30, 1351 (1959).
    • (1959) J. Appl. Phys. , vol.30 , pp. 1351-1359
    • Harman, T.C.1
  • 10
    • 20644444472 scopus 로고
    • 10.1103/PhysRevB.46.8237 1:CAS:528:DyaK38XmsVegs7s%3D
    • D.L. Decker and W. Chen, Phys. Rev. B 46, 8237 (1992).
    • (1992) Phys. Rev. B , vol.46 , pp. 8237
    • Decker, D.L.1    Chen, W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.