Plasmonic characteristics of Ag/ZnO back-reflectors for thin film Si photovoltaics

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2008, Pages

  Dahal, Lila Raj ^a   Sainju, Deepak ^a   Li, Jian ^a   Stoke, Jason A ^a   Podraza, N J ^a   Deng, Xunming ^a   Collins, Robert W ^a  

^a UNIVERSITY OF TOLEDO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC FUNCTIONS; DIPOLAR INTERACTION; INTERFACE FORMATION; INTERFACE PROTRUSIONS; INTERFACE THICKNESS; LOCALIZED PLASMON RESONANCE; REAL TIME SPECTROSCOPIC ELLIPSOMETRY; SCATTERING SPECTROSCOPY;

OPTIMIZATION; PLASMONS; REFLECTION; SILICON; SILICON WAFERS; SILVER; SPECTROSCOPIC ELLIPSOMETRY; TEXTURES; THIN FILMS;

INTERFACES (MATERIALS);

EID: 84879726118     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2008.4922502     Document Type: Conference Paper

References (4)

1. X. Deng and E. A. Schiff, in: Handbook of Photovoltaic Science and Engineering, edited by A Luque and S. Hegedus (Wiley, New York, 2003), p. 505.
2. D. Sainju, P. J. van den Oever, N. J. Podraza, M. Syed, JA Stoke, J. Chen, X. Yan-, X. Deng, and R. W. Collins, Proc. of the 4 World Cont. On Photovoltaic. Energy Conversion, (IEEE, Piscataway, NJ, 2006), p. 1732.
3. R. W. Collins and AS. Ferlauto, in Handbook of Ellipsometry, edited by H. G. Tompkins and E. A Irene (William Andrew, Norwhich, 2005), p. 93.
4. J. Springer, A Poruba, L. Mullerova, M. Vanecek, O. Kluth, and B. Rech, J. Appl. Phys. 95, 1427 (2004).