Origin of optical losses in Ag/ZnO back-reflectors for thin film Si photovoltaics

Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4

Volumn 2, Issue , 2006, Pages 1732-1735

  Sainju, D ^a   Van Den Oever, P J ^b   Podraza, N J ^a   Syed, M ^c   Stoke, J A ^a   Chen, Jie ^a   Yang, Xiesen ^a   Deng, Xunming ^a   Collins, R W ^a  

^a UNIVERSITY OF TOLEDO   (United States)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c ROSE HULMAN INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MIRRORS; PHOTOVOLTAIC CELLS; REFLECTION; SPUTTERING; THIN FILMS;

INTERFERENCE ENHANCED PLASMON ABSORPTION; ROTATING COMPENSATORS; ROUGHNESS LAYERS;

OPTICAL LOSSES;

EID: 41749115144     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WCPEC.2006.279826     Document Type: Conference Paper

References (4)

1. X. Deng and E.A. Schiff, in: Handbook of Photovoltaic Science and Engineering, edited by A. Luque and S. Hegedus (Wiley, New York, 2003), p. 505.
2. G.M. Ferreira, A.S. Ferlauto, P.I. Rovira, C.Chen, H.V. Nguyen, C.R. Wronski, and R.W. Collins, Mater. Res. Soc. Symp. Proc. 664, A24.6 (2001).
3. R.W. Collins and A.S. Ferlauto, in Handbook of Ellipsometry, (William Andrew, Norwich, NY, 2005), p. 93.
4. J. Springer, A. Poruba, L. Mullerova, M. Vanecek, O. Kluth, and B. Rech, J. Appl. Phys. 95, 1427 (2004).