Empirical investigation into the correlation between vignetting effect and the quality of sensor pattern noise

IET Computer Vision

Volumn 6, Issue 6, 2012, Pages 560-566

  Li, C T ^a   Satta, R ^b  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b UNIVERSITY OF CAGLIARI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL IMAGING DEVICES; EMPIRICAL INVESTIGATION; FORENSIC APPLICATIONS; FORENSIC INVESTIGATION; IDENTIFICATION OF SOURCES; SENSOR PATTERN NOISE; SENSOR PATTERN NOISES (SPN); SOURCE CAMERA IDENTIFICATIONS;

SENSORS;

IMAGE PROCESSING;

EID: 84879721477     PISSN: 17519632     EISSN: 17519640     Source Type: Journal    
DOI: 10.1049/iet-cvi.2012.0044     Document Type: Article

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