Intrinsic sensor noise features for forensic analysis on scanners and scanned images

IEEE Transactions on Information Forensics and Security

Volumn 4, Issue 3, 2009, Pages 476-491

  Gou, Hongmei ^a   Swaminathan, Ashwin ^b   Wu, Min ^c  

^a TEXAS INSTRUMENTS   (United States)

^b QUALCOMM INC   (United States)

^c UNIVERSITY OF MARYLAND   (United States)

Author keywords

Acquisition apparatus identification; Image forensics; Scanner forensics; Scanning noise; Tampering detection

Indexed keywords

ACQUISITION APPARATUS IDENTIFICATION; CONTROLLED ENVIRONMENT; DIGITAL IMAGE; DIGITAL REPRODUCTIONS; FORENSIC ANALYSIS; IMAGE DE-NOISING; IMAGE FORENSICS; NATURAL SCENES; NON-INTRUSIVE; SCANNED IMAGES; SCANNER FORENSICS; SENSOR NOISE; STATISTICAL FEATURES; TAMPERING DETECTION;

CAMERAS; COLOR IMAGE PROCESSING; MERGERS AND ACQUISITIONS; PHOTOGRAPHY; SENSORS; WAVELET ANALYSIS;

SCANNING;

EID: 69749111736     PISSN: 15566013     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIFS.2009.2026458     Document Type: Article

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