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Volumn 539, Issue , 2013, Pages 384-390

High-temperature conductivity evaluation of Nb doped SrTiO3 thin films: Influence of strain and growth mechanism

(6) Aguesse, Frédéric a,b Axelsson, Anna Karin a Reinhard, Patrick c Tileli, Vasiliki a Rupp, Jennifer L M d Alford, Neil McN a

a LONDON CENTRE FOR NANOTECHNOLOGY (United Kingdom)

b CIC ENERGIGUNE (Spain)

c ETH ZURICH (Switzerland)

d Massachusetts Institute of Technology Cambridge (United States)

Author keywords

Conductive oxides; Doped perovskite; Induced strain; Thin films

Indexed keywords

CONDUCTIVE OXIDES; CRITICAL THICKNESS; ELEVATED TEMPERATURE; FILM GROWTH MECHANISM; GROWTH MECHANISMS; HIGH TEMPERATURE CONDUCTIVITY; INDUCED STRAIN; SIGNIFICANT DIFFERENCES;

DEFECTS; LANTHANUM ALLOYS; NIOBIUM; NIOBIUM COMPOUNDS; PULSED LASER DEPOSITION; STRONTIUM TITANATES; SUBSTRATES; THIN FILMS;

FILM GROWTH;

EID: 84879420421 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2013.05.094 Document Type: Article

Times cited : (10)

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