Microstructural analyses of a highly conductive Nb-doped SrTiO3 film

Acta Materialia

Volumn 53, Issue 5, 2005, Pages 1277-1284

  Zhu, Y L ^a   Ma, X L ^a   Li, D X ^a   Lu, H B ^b   Chen, Z H ^b   Yang, G Z ^b  

^a INSTITUTE OF METAL RESEARCH   (China)

^b INSTITUTE OF PHYSICS   (China)

Author keywords

Interface structure; Nb doped SrTiO3; Transmission electron microscopy

Indexed keywords

DIFFUSION; DISLOCATIONS (CRYSTALS); DOPING (ADDITIVES); ELECTRIC PROPERTIES; ENERGY DISPERSIVE SPECTROSCOPY; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; SINGLE CRYSTALS; STRONTIUM COMPOUNDS; SUBSTRATES; SURFACE TENSION; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VECTORS;

ELECTRICAL PROPERTIES; INTERFACE STRUCTURES; NB-DOPED SRTIO3; ROOM TEMPERATURE;

NIOBIUM;

EID: 13444251020     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2004.11.020     Document Type: Article

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