Circuit demonstration of radiation hardened chalcogenide non-volatile memory

IEEE Aerospace Conference Proceedings

Volumn 5, Issue , 2003, Pages 2373-2379

  Maimon, J ^a   Hunt, K ^b   Rodgers, J ^c   Burcin, L ^c   Knowles, K ^c  

^a Ovonyx Inc   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

^c General Atomics   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAE SYSTEMS; CMOS TECHNOLOGY; ELECTRICAL TESTS; MEMORY ELEMENT; NON-VOLATILE MEMORY; RADIATION TESTING; RADIATION-HARDENED; SINGLE-BIT;

CMOS INTEGRATED CIRCUITS; DATA STORAGE EQUIPMENT; ELECTRIC INSULATION TESTING;

RADIATION HARDENING;

EID: 84879391020     PISSN: 1095323X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AERO.2003.1235161     Document Type: Conference Paper

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