Surface morphology and raman analysis of the polyimide film aged under bipolar pulse voltage

Polymer Engineering and Science

Volumn 53, Issue 7, 2013, Pages 1536-1541

  Yang, Yang ^a   Yin, Di ^a   Zhong, Chuyu ^a   Xiong, Rui ^a   Shi, Jing ^a   Liu, Zhengyou ^a   Wang, Xuan ^a,b   Lei, Qingquan ^a,b  

^a WUHAN UNIVERSITY   (China)

^b HARBIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BOND STRENGTH (CHEMICAL); CHEMICAL ANALYSIS; ELECTRIC FIELDS; MORPHOLOGY; POLYIMIDES; PROCESSING;

BIPOLAR PULSE; CORONA AGING; CORONA RESISTANCE; FURTHER DEVELOPMENT; HIGH PROCESSING TEMPERATURES; NEEDLE-PLANE; POLYIMIDE FILM; PULSE VOLTAGE; RAMAN ANALYSIS; SURFACE MORPHOLOGY ANALYSIS;

SURFACE MORPHOLOGY;

EID: 84879210174     PISSN: 00323888     EISSN: 15482634     Source Type: Journal    
DOI: 10.1002/pen.23384     Document Type: Article

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