Structure determination of MnO2 films grown on single crystal α-Al2O3 substrates

Philosophical Magazine

Volumn 85, Issue 23, 2005, Pages 2689-2705

  Foss, S ^a   Nilsen, O ^a   Olsen, A ^a   Tafto J ^a  

^a UNIVERSITY OF OSLO   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; SINGLE CRYSTALS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ATOMIC LAYER DEPOSITION; HIGH-RESOLUTION ELECTRON MICROSCOPY (HREM); STRUCTURE DETERMINATION;

MANGANESE COMPOUNDS;

EID: 27944509551     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430500154166     Document Type: Article

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